Question 1.
The time to failure in hours of an electronic component subjected to an accelerated life test is shown in the following table. To accelerate the failure test, the units were tested at an elevated temperature (read down, then across).
| Table 1: Electronic Component Failure Time (in hours) | |||
| 127 | 124 | 121 | 118 |
| 125 | 123 | 136 | 131 |
| 131 | 120 | 140 | 125 |
| 124 | 119 | 137 | 133 |
| 129 | 128 | 125 | 141 |
| 121 | 133 | 124 | 125 |
| 142 | 137 | 128 | 140 |
| 151 | 124 | 129 | 131 |
| 160 | 142 | 130 | 129 |
| 125 | 123 | 122 | 126 |
- Calculate the sample average.
- Calculate the sample standard deviation.
- Find the sample median and the lower and upper quartiles.
- Construct a histogram.
- Construct a box and whisker plot.
Question 2.
The data shown in the following table are chemical process yield readings on successive days (read down, then across).
| Table 2: Daily Chemical Process Yield | |||||
| 94.1 | 87.3 | 94.1 | 92.4 | 84.6 | 85.4 |
| 93.2 | 84.1 | 92.1 | 90.6 | 83.6 | 86.6 |
| 90.6 | 90.1 | 96.4 | 89.1 | 85.4 | 91.7 |
| 91.4 | 95.2 | 88.2 | 88.8 | 89.7 | 87.5 |
| 88.2 | 86.1 | 86.4 | 86.4 | 87.6 | 84.2 |
| 86.1 | 94.3 | 85.0 | 85.1 | 85.1 | 85.1 |
| 95.1 | 93.2 | 84.9 | 84.0 | 89.6 | 90.5 |
| 90.0 | 86.7 | 87.3 | 93.7 | 90.0 | 95.6 |
| 92.4 | 83.0 | 89.6 | 87.7 | 90.1 | 88.3 |
| 87.3 | 95.3 | 90.3 | 90.6 | 94.3 | 84.1 |
| 86.6 | 84.1 | 93.1 | 89.4 | 97.3 | 83.7 |
| 91.2 | 97.8 | 94.6 | 88.6 | 96.8 | 82.9 |
| 86.1 | 93.1 | 96.3 | 84.1 | 94.4 | 87.3 |
| 90.4 | 86.4 | 94.7 | 82.6 | 96.1 | 86.4 |
| 89.1 | 87.6 | 91.1 | 83.1 | 98.0 | 84.5 |
- Calculate the sample average.
- Calculate the sample standard deviation.
- Find the sample median and the lower and upper quartiles.
- Construct a histogram.
- Construct a box and whisker plot.
