The general theory of how XRR works, and what information it gives, including thin film layer thickness measurement via software fitting. Also at least one visual on additional pages showing typical layout, axis, source, slits, etc, and detector; an example graph showing the characteristics visualizing density, thickness, and roughness indicators; and a layer profile describing x-ray reflection in a layer on top of a substrate. As well as scholarly references.
This is for a section of a Semiconductor Physics Master’s Thesis regarding the production and measurement of 2D thin film materials 0.5nm+ thick. I basically need a reworded description to pass the plagiarism checker TurnItIn.
The description should be easily found described in scholarly papers and books on XRD (X-ray diffraction) and XRR, thin film/2D material measurement.
Background; I am using a Bede-1 HR-XRD machine (obsolete-20 years old) for XRR omega-2theta measurement, mainly to obtain data that can be used to estimate our 0.5nm-200nm layer thicknesses using GenX fitting software. I will attach a classmates example description of this XRD machine (although it doesn’t describe XRR measurement mode).
FYI – I am planning on soon submitting a similar writing project for general description of Grazing Incidence X-ray Diffraction (GIXRD), another 1 page text, what it is used to measure, and with additional visuals showing axis, reflection, detection, etc. This 2nd writing is regarding this same machine, just another mode, so should be similar to this project. If writer is interested let me know. I assume these can be combined into one project using same references.
